| 一裂片后的OLED Cell, 在还沒Bond Driver IC之前, 将所有正极短路, 所有负极亦短路(以PM型为例), 而后在该二端点上加上正及负的电压做测试 | 该交流测试电压的大小, 頻率, 及週波数皆为Programmable(可在主控PC上設定), 在一次的交流测试后,紧接着为量测段, 使用者先设定反偏电压, HA570会对每一片面板量测其反偏逆电流並记录, 解析精度至10nA. | | 无论順向或逆向, HA570均提供限流保护, 可使某些先期不稳定的产品不至于断电而有可能在持续的交流测试中复元. | | OLED Cell是置于治具—电木Tray盘上, 一个Tray可置放30pc Cells, 一炉共可容納 : 24 Tray x 30 Cell = 720 Cell/炉. |
| | | Aging Process | | Item | Parameter | Remark | Total cycle
| Programmable 1~100
| | | Tt | 1~250 min., 1 min. step
| Fwd Voltage | | Tm | 60 sec. | Measurement cycle time | | Vft | 0~+20V, 0.1V step
| Set for each cycle/each tray | | Vrt | 0~-20V, 0.1V step | Set for each cycle/each tray | | Vrm | 0~-20V, 0.1V step | Reverse voltage of Tm, Set for each cycle | | f | 1~100Hz, 1 Hz step | 1/T, Frequency of Tt | | Duty cycle | 5%~100%, 1% step | Tf/T, rising time/falling time < 10uS | | If | 200mA max. | Output current |
| | | Measurement | | Item | Parameter | Remark | | IF | 0.1mA~200mA, 0.1mA step
| Fwd current | | Ir | Accuracy: 1. 10nA~1uA:10nA 2. 1uA~100uA:5% | Static-state Leakage Current |
| | | Current Limit | | Item | Parameter | Remark | If current limit
| 200mA | Set for each cell | | IR current limit | 200mA | Set for each cell |
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